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标题:Prognostics and health management of electronics
时间:2020-10-18 15:13:38
DOI:10.1109/TCAPT.2006.870387
大小:544 kb
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目录:
  • toc
    • Prognostics and Health Management of Electronics
    • Nikhil M. Vichare and Michael G. Pecht, Fellow, IEEE
      • I. I NTRODUCTION
      • II. B UILT - IN -T EST
      • III. F USES AND C ANARIES
    • Fig.€1. Advance warning of failure using canary structures.
      • IV. M ONITORING P RECURSORS TO F AILURE
    • TABLE I P OTENTIAL F AILURE P RECURSORS FOR E LECTRONICS
    • TABLE II M ONITORING P ARAMETERS B ASED ON R ELIABILITY C ONCERN
    • Fig.€2. SUN's approach to PHM.
      • V. M ONITORING E NVIRONMENTAL AND U SAGE L OADS
    • TABLE III E XAMPLES OF L IFE -C YCLE L OADS
    • Fig.€3. CALCE life consumption monitoring methodology.
    • Fig.€4. CALCE PHM using monitored load histories.
      • VI. PHM I NTEGRATION
      • C. T. Leonard and M. G. Pecht, Improved techniques for cost effe
      • M. Karyagina, Designing for fault-tolerance in the commercial en
      • A. A. Shapiro, S. X. Ling, S. Ganesan, R. S. Cozy, D. J. Hunter,
      • I. Tumer and A. Bajwa, A survey of aircraft engine health monito
      • E. P. Carden and P. Fanning, Vibration based condition monitorin
      • P. Chang, A. Flatau, and S. Liu, Review paper: Health monitoring
      • M. Krok and K. Goebel, Prognostics for advanced compressor healt
      • G. J. Kacprzynski, M. J. Roemer, G. Modgil, and A. Palladino, En
      • J. Xie and M. Pecht, Application of in-situ health monitoring an
      • N. Vichare, P. Rodgers, V. Eveloy, and M. G. Pecht, Monitoring e
    • Condition Based Maintenance Plus (2005). [Online] . Available: h
      • Department of Defense, Performance Based Logistics: DoD 5000.2 P
      • D. Cutter and O. Thompson, Condition-Based Maintenance Plus Sele
      • L. V. Kirkland, T. Pombo, K. Nelson, and F. Berghout, Avionics h
      • R. Drees and N. Young, Role of BIT in support system maintenance
      • M. Pecht, M. Dube, M. Natishan, and I. Knowles, An evaluation of
    • Motorola Built-In Test Diagnostic Software (2002). [Online] . Av
      • S. P. Broadwater, T. A. Oblak, and L. J. Popyack, Maintenance pr
      • S. P. Broadwater and E. A. Cockey, Time stress measurement devic
      • D. Johnson, Review of fault management techniques used in safety
      • D. Allen, Probabilities associated with a built-in-test system,
      • R. X. Gao and A. Suryavanshi, BIT for intelligent system design
      • D. Rosenthal and B. Wadell, Predicting and eliminating built-in
      • R. Williams, J. Banner, I. Knowles, M. Natishan, and M. Pecht, A
    • A. Ramakrishnan, T. Syrus, and M. Pecht, Eds., Avionics Handbook
      • S. Mishra and M. Pecht, In-situ sensors for product reliability
    • Hot Carrier (HC) Prognostic Cell, Ridgetop Semiconductor-Sentine
      • N. Anderson and R. Wilcoxon, Framework for prognostics of electr
      • S. Ganesan, V. Eveloy, D. Das, and M. G. Pecht, Identification a
      • F. Born and R. A. Boenning, Marginal checking A technique to det
      • M. G. Pecht, R. Radojcic, and G. Rao, Guidebook for Managing Sil
      • P. A. Smith and D. V. Campbell, Practical implementation of BICS
      • I. Pecuh, M. Margala, and V. Stopjakova, 1.5 Volts iddq/iddt cur
      • B. Xue and D. M. H. Walker, Built-in current sensor for IDDQ tes
      • R. G. Wright and L. V. Kirkland, Nano-scaled electrical sensor d
      • R. G. Wright, M. Zgol, D. Adebimpe, and L. V. Kirkland, Function
      • R. G. Wright, M. Zgol, S. Keeton, and L. V. Kirkland, Nanotechno
      • M. S. Kanniche and M. R. Mamat-Ibrahim, Wavelet based fuzzy algo
      • P. Lall, N. Islam, K. Rahim, J. Suhling, and S. Gale, Leading in
      • P. Lall, N. Islam, and J. Suhling, Prognostication and health mo
    • Self-Monitoring Analysis and Reporting Technology (SMART) (2005)
      • G. F. Hughes, J. F. Murray, K. Kreutz-Delgado, and C. Elkan, Imp
      • K. Gross, Continuous System Telemetry Harness, Tech. Rep., [Onli
      • K. Whisnant, K. Gross, and N. Lingurovska, Proactive fault monit
      • K. Mishra and K. C. Gross, Dynamic stimulation tool for improved
      • K. Cassidy, K. C. Gross, and A. Malekpour, Advanced pattern reco
      • K. Vaidyanathan and K. C. Gross, MSET performance optimization f
      • D. Brown, P. Kalgren, C. Byington, and R. Orsagh, Electronic pro
      • A. Ramakrishnan and M. Pecht, A life consumption monitoring meth
      • S. Mishra, M. Pecht, T. Smith, I. McNee, and R. Harris, Remainin
      • S. Mathew, D. Das, M. Osterman, M. G. Pecht, and R. Ferebee, Pro
      • V. Shetty, D. Das, M. Pecht, D. Hiemstra, and S. Martin, Remaini
      • N. Harchani, F. Jimenez, M. Almohamed, D. Esteve, and M. Courvoi
      • V. Rouet and B. Foucher, Development and use of a miniaturized h
      • D. Searls, T. Dishongh, and P. Dujari, A Strategy for enabling d
      • G. Herbst, IBM's Drive Temperature Indicator Processor (drive-TI
      • N. Vichare, P. Rodgers, V. Eveloy, and M. G. Pecht, In-situ temp
      • K. Bodenhoefer, Environmental life cycle information management
    • D-19 Final Report on ELIMA Prospects and Wider Potential for Exp
      • V. A. Skormin, V. I. Gorodetski, and L. J. Popyack, Data mining
      • S. Mishra, S. Ganesan, M. Pecht, and J. Xie, Life consumption mo
      • R. Orsagh, D. Brown, M. Roemer, T. Dabney, and A. Hess, Prognost
      • D. Goodman, B. Vermeire, P. Spuhler, and H. Venkatramani, Practi

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